Editorial 6th International Conference on Near-field Optics and Related Techniques

N.F. van Hulst

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Abstract

This topical issue of the Journal of Microscopy contains all of the papers are based on work presented at NFO-6, the 6th International Conference on Near-field Optics and Related Techniques, held at the University of Twente, Enschede, the Netherlands, 27-31 August 2000.
Original languageUndefined
Pages (from-to)1-1
Number of pages1
JournalJournal of microscopy
Volume202 Pt 1
Issue number753
DOIs
Publication statusPublished - 2001

Keywords

  • METIS-203127
  • IR-36820

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