Abstract
Oblique deposition of magnetic films is often used for magnetic recording tape. The well known materials are Co and CoNi deposited by reactive evaporation with O/sub 2/ directly on a polymer substrate. However, for the next generation of high density media the desirable magnetic properties have not been achieved by this method. In our previous work, oblique sputtering of Co on a PET substrate resulted in a relative low H/sub c/, which mainly originates from shape anisotropy, as the films only consist of the fcc Co phase. In this paper, properties of sputtered Co on a Cr underlayer at an incident angle of 70/spl deg/ are reported. Microstructure and magnetic analyses of the Co layer reveal a strong influence of the Cr underlayer.
Original language | Undefined |
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DOIs | |
Publication status | Published - 2002 |
Event | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - RAI Congress Center, Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002 |
Conference
Conference | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 |
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Abbreviated title | INTERMAG Europe 2002 |
Country/Territory | Netherlands |
City | Amsterdam |
Period | 28/04/02 → 2/05/02 |
Keywords
- IR-55901