Abstract
We have investigated various kinds of nanowires (Si, Bi2Te 3, SiGe) in order to evaluate the influence of the nanostructuration on their thermal conductivity. The method used is a 3ω-SThM (Scanning Thermal Microscopy) technique which enables to simultaneously measure the topography and the thermal conductivity on an assembly of NWs. We detail the procedure from the measurement itself to the nanowire thermal conductivity estimation. We show that the nanostructuration leads to a thermal conductivity reduction for the 3 materials we have studied and that Si and SiGe nanowire samples seem more promising than Bi2Te3 NWs in terms of thermoelectric applications.
Original language | English |
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Title of host publication | 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
Pages | 73-78 |
Number of pages | 6 |
ISBN (Electronic) | 978-1-4799-2272-7 |
DOIs | |
Publication status | Published - 1 Jan 2013 |
Externally published | Yes |
Event | 19th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2013 - Fraunhofer Forum, Berlin, Germany Duration: 25 Sept 2013 → 27 Sept 2013 Conference number: 19 |
Conference
Conference | 19th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2013 |
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Abbreviated title | THERMINIC 2013 |
Country/Territory | Germany |
City | Berlin |
Period | 25/09/13 → 27/09/13 |