Effect of tensile strain on grain connectivity and flux pinning in Bi2Sr2Cu3Ox tapes

D.C. van der Laan, J.W. Ekin, H.J.N. van Eck, H.J.N. van Eck, Marc M.J. Dhalle, Bernard ten Haken, M.W. Davidson, J. Schwartz

Research output: Contribution to journal › Article › Academic › peer-review

14 Citations (Scopus)
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