Efficient inspection in semiconductor industry

W. Albers; G.R.J. Arts; W.C.M. Kallenberg

Efficient inspection in semiconductor industry

W. Albers, G.R.J. Arts, W.C.M. Kallenberg

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 51th session of the International Statistical Institute
Place of Publication	Voorburg, The Netherlands
Publisher	International Statistical Institute
Pages	297-298
Number of pages	2
Publication status	Published - 1997
Event	51th Session of the International Statistical Institute 1997 - Istanbul, Turkey Duration: 18 Aug 1997 → 26 Aug 1997 Conference number: 51

Publication series

Name	Bulletin of the International Statistical Institute
Publisher	International Statistical Institute
Number	book 1
Volume	LVII
ISSN (Print)	0373-0441

Conference

Conference	51th Session of the International Statistical Institute 1997
Country/Territory	Turkey
City	Istanbul
Period	18/08/97 → 26/08/97

Keywords

EWI-13153

Cite this

@inproceedings{dbb5416b04a043499a37a7e9148685bb,

title = "Efficient inspection in semiconductor industry",

keywords = "EWI-13153",

author = "W. Albers and G.R.J. Arts and W.C.M. Kallenberg",

year = "1997",

language = "English",

series = "Bulletin of the International Statistical Institute",

publisher = "International Statistical Institute",

number = "book 1",

pages = "297--298",

booktitle = "Proceedings of the 51th session of the International Statistical Institute",

address = "Netherlands",

note = "51th Session of the International Statistical Institute 1997 ; Conference date: 18-08-1997 Through 26-08-1997",

}

Albers, W, Arts, GRJ & Kallenberg, WCM 1997, Efficient inspection in semiconductor industry. in Proceedings of the 51th session of the International Statistical Institute. Bulletin of the International Statistical Institute, no. book 1, vol. LVII, International Statistical Institute, Voorburg, The Netherlands, pp. 297-298, 51th Session of the International Statistical Institute 1997, Istanbul, Turkey, 18/08/97.

Efficient inspection in semiconductor industry. / Albers, W.; Arts, G.R.J.; Kallenberg, W.C.M.
Proceedings of the 51th session of the International Statistical Institute. Voorburg, The Netherlands: International Statistical Institute, 1997. p. 297-298 (Bulletin of the International Statistical Institute; Vol. LVII, No. book 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Efficient inspection in semiconductor industry

AU - Albers, W.

AU - Arts, G.R.J.

AU - Kallenberg, W.C.M.

N1 - Conference code: 51

PY - 1997

Y1 - 1997

KW - EWI-13153

M3 - Conference contribution

T3 - Bulletin of the International Statistical Institute

SP - 297

EP - 298

BT - Proceedings of the 51th session of the International Statistical Institute

PB - International Statistical Institute

CY - Voorburg, The Netherlands

T2 - 51th Session of the International Statistical Institute 1997

Y2 - 18 August 1997 through 26 August 1997

ER -