Efficient inspection in semiconductor industry

Willem/Wim Albers, G.R.J. Arts, W.C.M. Kallenberg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 51th session of the International Statistical Institute
    Place of PublicationVoorburg, The Netherlands
    PublisherInternational Statistical Institute
    Pages297-298
    Number of pages2
    Publication statusPublished - 1997
    Event51th Session of the International Statistical Institute 1997 - Istanbul, Turkey
    Duration: 18 Aug 199726 Aug 1997
    Conference number: 51

    Publication series

    NameBulletin of the International Statistical Institute
    PublisherInternational Statistical Institute
    Numberbook 1
    VolumeLVII
    ISSN (Print)0373-0441

    Conference

    Conference51th Session of the International Statistical Institute 1997
    CountryTurkey
    CityIstanbul
    Period18/08/9726/08/97

    Keywords

    • EWI-13153

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