Efficient inspection in semiconductor industry

Willem/Wim Albers, G.R.J. Arts, W.C.M. Kallenberg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 51th session of the International Statistical Institute
    Place of PublicationVoorburg, The Netherlands
    PublisherInternational Statistical Institute
    Pages297-298
    Number of pages2
    Publication statusPublished - 1997

    Publication series

    NameBulletin of the International Statistical Institute
    PublisherInternational Statistical Institute
    Numberbook 1
    VolumeLVII
    ISSN (Print)0373-0441

    Keywords

    • EWI-13153

    Cite this

    Albers, WW., Arts, G. R. J., & Kallenberg, W. C. M. (1997). Efficient inspection in semiconductor industry. In Proceedings of the 51th session of the International Statistical Institute (pp. 297-298). (Bulletin of the International Statistical Institute; Vol. LVII, No. book 1). Voorburg, The Netherlands: International Statistical Institute.
    Albers, Willem/Wim ; Arts, G.R.J. ; Kallenberg, W.C.M. / Efficient inspection in semiconductor industry. Proceedings of the 51th session of the International Statistical Institute. Voorburg, The Netherlands : International Statistical Institute, 1997. pp. 297-298 (Bulletin of the International Statistical Institute; book 1).
    @inproceedings{dbb5416b04a043499a37a7e9148685bb,
    title = "Efficient inspection in semiconductor industry",
    keywords = "EWI-13153",
    author = "Willem/Wim Albers and G.R.J. Arts and W.C.M. Kallenberg",
    year = "1997",
    language = "Undefined",
    series = "Bulletin of the International Statistical Institute",
    publisher = "International Statistical Institute",
    number = "book 1",
    pages = "297--298",
    booktitle = "Proceedings of the 51th session of the International Statistical Institute",
    address = "Netherlands",

    }

    Albers, WW, Arts, GRJ & Kallenberg, WCM 1997, Efficient inspection in semiconductor industry. in Proceedings of the 51th session of the International Statistical Institute. Bulletin of the International Statistical Institute, no. book 1, vol. LVII, International Statistical Institute, Voorburg, The Netherlands, pp. 297-298.

    Efficient inspection in semiconductor industry. / Albers, Willem/Wim; Arts, G.R.J.; Kallenberg, W.C.M.

    Proceedings of the 51th session of the International Statistical Institute. Voorburg, The Netherlands : International Statistical Institute, 1997. p. 297-298 (Bulletin of the International Statistical Institute; Vol. LVII, No. book 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Efficient inspection in semiconductor industry

    AU - Albers, Willem/Wim

    AU - Arts, G.R.J.

    AU - Kallenberg, W.C.M.

    PY - 1997

    Y1 - 1997

    KW - EWI-13153

    M3 - Conference contribution

    T3 - Bulletin of the International Statistical Institute

    SP - 297

    EP - 298

    BT - Proceedings of the 51th session of the International Statistical Institute

    PB - International Statistical Institute

    CY - Voorburg, The Netherlands

    ER -

    Albers WW, Arts GRJ, Kallenberg WCM. Efficient inspection in semiconductor industry. In Proceedings of the 51th session of the International Statistical Institute. Voorburg, The Netherlands: International Statistical Institute. 1997. p. 297-298. (Bulletin of the International Statistical Institute; book 1).