Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

Ahmed Mohammed Youssef Ibrahim*, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)

    Abstract

    The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.
    Original languageEnglish
    Title of host publicationIEEE VLSI Test Symposium (VTS)
    Subtitle of host publicationVTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA)
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages1-6
    Number of pages6
    ISBN (Electronic)978-1-7281-1170-4
    DOIs
    Publication statusPublished - 23 Apr 2019
    Event37th IEEE VLSI Test Symposium, VLSI 2019: Test Reliability and Security Challenges in VLSI Systems - Monterey, United States
    Duration: 23 Apr 201925 Apr 2019

    Conference

    Conference37th IEEE VLSI Test Symposium, VLSI 2019
    Abbreviated titleVLSI 2019
    CountryUnited States
    CityMonterey
    Period23/04/1925/04/19

    Keywords

    • Embedded Instruments
    • IEEE 1687 Standard
    • IJTAG
    • Structured retargeting

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