Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.
Original languageEnglish
Title of host publicationIEEE VLSI Test Symposium (VTS)
Subtitle of host publicationVTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA)
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1-6
Number of pages6
ISBN (Electronic)978-1-7281-1170-4
DOIs
Publication statusPublished - 23 Apr 2019
Event37th IEEE VLSI Test Symposium, VLSI 2019: Test Reliability and Security Challenges in VLSI Systems - Monterey, United States
Duration: 23 Apr 201925 Apr 2019

Conference

Conference37th IEEE VLSI Test Symposium, VLSI 2019
Abbreviated titleVLSI 2019
CountryUnited States
CityMonterey
Period23/04/1925/04/19

Fingerprint

Monitoring

Keywords

  • Embedded Instruments
  • IEEE 1687 Standard
  • IJTAG
  • Structured retargeting

Cite this

Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M., & El-Kharashi, M. W. (2019). Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. In IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA) (pp. 1-6). Piscataway, NJ: IEEE. https://doi.org/10.1109/VTS.2019.8758635
Ibrahim, Ahmed Mohammed Youssef ; Kerkhoff, Hans G. ; Ibrahim, Abrar ; Safar, Mona ; El-Kharashi, M. Watheq. / Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ : IEEE, 2019. pp. 1-6
@inproceedings{188ef8ee653f4d5e9b7d6a9ca656d2b5,
title = "Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks",
abstract = "The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.",
keywords = "Embedded Instruments, IEEE 1687 Standard, IJTAG, Structured retargeting",
author = "Ibrahim, {Ahmed Mohammed Youssef} and Kerkhoff, {Hans G.} and Abrar Ibrahim and Mona Safar and El-Kharashi, {M. Watheq}",
year = "2019",
month = "4",
day = "23",
doi = "10.1109/VTS.2019.8758635",
language = "English",
pages = "1--6",
booktitle = "IEEE VLSI Test Symposium (VTS)",
publisher = "IEEE",
address = "United States",

}

Ibrahim, AMY, Kerkhoff, HG, Ibrahim, A, Safar, M & El-Kharashi, MW 2019, Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. in IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). IEEE, Piscataway, NJ, pp. 1-6, 37th IEEE VLSI Test Symposium, VLSI 2019, Monterey, United States, 23/04/19. https://doi.org/10.1109/VTS.2019.8758635

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.; Ibrahim, Abrar; Safar, Mona ; El-Kharashi, M. Watheq.

IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ : IEEE, 2019. p. 1-6.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

AU - Ibrahim, Ahmed Mohammed Youssef

AU - Kerkhoff, Hans G.

AU - Ibrahim, Abrar

AU - Safar, Mona

AU - El-Kharashi, M. Watheq

PY - 2019/4/23

Y1 - 2019/4/23

N2 - The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.

AB - The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.

KW - Embedded Instruments

KW - IEEE 1687 Standard

KW - IJTAG

KW - Structured retargeting

U2 - 10.1109/VTS.2019.8758635

DO - 10.1109/VTS.2019.8758635

M3 - Conference contribution

SP - 1

EP - 6

BT - IEEE VLSI Test Symposium (VTS)

PB - IEEE

CY - Piscataway, NJ

ER -

Ibrahim AMY, Kerkhoff HG, Ibrahim A, Safar M, El-Kharashi MW. Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. In IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE. 2019. p. 1-6 https://doi.org/10.1109/VTS.2019.8758635