Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

Ahmed Mohammed Youssef Ibrahim; Hans G. Kerkhoff; Abrar Ibrahim; Mona  Safar; M. Watheq El-Kharashi

doi:10.1109/VTS.2019.8758635

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

Ahmed Mohammed Youssef Ibrahim^*, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

Abstract

The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.

Original language	English
Title of host publication	IEEE VLSI Test Symposium (VTS)
Subtitle of host publication	VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA)
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Electronic)	978-1-7281-1170-4
DOIs	https://doi.org/10.1109/VTS.2019.8758635
Publication status	Published - 23 Apr 2019
Event	37th IEEE VLSI Test Symposium, VLSI 2019: Test Reliability and Security Challenges in VLSI Systems - Monterey, United States Duration: 23 Apr 2019 → 25 Apr 2019

Conference

Conference	37th IEEE VLSI Test Symposium, VLSI 2019
Abbreviated title	VLSI 2019
Country	United States
City	Monterey
Period	23/04/19 → 25/04/19

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Keywords

Embedded Instruments
IEEE 1687 Standard
IJTAG
Structured retargeting

Cite this

Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M., & El-Kharashi, M. W. (2019). Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. In IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA) (pp. 1-6). Piscataway, NJ: IEEE. https://doi.org/10.1109/VTS.2019.8758635

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title = "Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks",

abstract = "The IEEE 1687 standard introduced a large design space of compliant networks for accessing embedded instruments. Such networks could grow in their structural complexity and inter-component temporal dependencies. Scan pattern retargeting is defined as the procedure of translating an instrument-level pattern to several network-level ones. Pattern retargeting could become computationally intensive with the increase of structural and temporal dependencies. Structured pattern retargeting was previously introduced as a formal and light-weight pattern retargeting methodology for arbitrary IEEE 1687 networks. In this work, we present a dedicated structured retargeting method for hierarchical IEEE 1687 networks. The proposed method significantly reduces the retargeting time for pure hierarchical networks compared to the general one, while resulting in the same network access time. The retargeting time is of a special importance in the case of on-chip retargeting, which is used for on-line monitoring using IEEE 1687 networks.",

keywords = "Embedded Instruments, IEEE 1687 Standard, IJTAG, Structured retargeting",

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Ibrahim, AMY, Kerkhoff, HG, Ibrahim, A, Safar, M & El-Kharashi, MW 2019, Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. in IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). IEEE, Piscataway, NJ, pp. 1-6, 37th IEEE VLSI Test Symposium, VLSI 2019, Monterey, United States, 23/04/19. https://doi.org/10.1109/VTS.2019.8758635

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.; Ibrahim, Abrar; Safar, Mona ; El-Kharashi, M. Watheq.

IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ : IEEE, 2019. p. 1-6.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Access to Document

10.1109/VTS.2019.8758635

https://ieeexplore.ieee.org/document/8758635