Efficient test generation for mixed-signal ICs

V. Kaal, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the ProRISC/IEEE Benelux workshop on Circuits, Systems and Signal processing
Place of Publication	Mierlo, The Netherlands
Pages	159-164
Publication status	Published - 23 Mar 1995

Keywords

@inproceedings{a7fbda5205364c2399fceb53d91083c4,

title = "Efficient test generation for mixed-signal ICs",

keywords = "METIS-112927",

author = "V. Kaal and Kerkhoff, {Hans G.}",

year = "1995",

month = mar,

day = "23",

language = "Undefined",

pages = "159--164",

booktitle = "Proceedings of the ProRISC/IEEE Benelux workshop on Circuits, Systems and Signal processing",

}