Efficient test generation for mixed-signal ICs

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    Original languageUndefined
    Title of host publicationProceedings of the ProRISC/IEEE Benelux workshop on Circuits, Systems and Signal processing
    Place of PublicationMierlo, The Netherlands
    Pages159-164
    Publication statusPublished - 23 Mar 1995

    Keywords

    • METIS-112927

    Cite this

    Kaal, V., & Kerkhoff, H. G. (1995). Efficient test generation for mixed-signal ICs. In Proceedings of the ProRISC/IEEE Benelux workshop on Circuits, Systems and Signal processing (pp. 159-164). Mierlo, The Netherlands.