Efficient test generation for mixed-signal ICs

V. Kaal, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ProRISC/IEEE Benelux workshop on Circuits, Systems and Signal processing
    Place of PublicationMierlo, The Netherlands
    Publication statusPublished - 23 Mar 1995


    • METIS-112927

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