Efficient test pattern generation for delay faults

G. van Brakel, Y. Xing, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings IEEE & ProRisc Workshop on Circuits, Systems and Signal Processing
    Place of PublicationHouthalen, Belgium
    Number of pages0
    Publication statusPublished - 1 Apr 1992


    • METIS-112934

    Cite this