Efficient test pattern generation for delay faults

G. van Brakel, Y. Xing, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings IEEE & ProRisc Workshop on Circuits, Systems and Signal Processing
Place of Publication	Houthalen, Belgium
Pages	265-270
Number of pages	0
Publication status	Published - 1 Apr 1992

Keywords

@inproceedings{059c808bbee1424aacb33ae5270f9ef6,

title = "Efficient test pattern generation for delay faults",

keywords = "METIS-112934",

author = "\{van Brakel\}, G. and Y. Xing and Kerkhoff, \{Hans G.\}",

year = "1992",

month = apr,

day = "1",

language = "Undefined",

pages = "265--270",

booktitle = "Proceedings IEEE \& ProRisc Workshop on Circuits, Systems and Signal Processing",

}