Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management

Ahmed Mohammed Youssef Ibrahim; Hans G. Kerkhoff

doi:10.1109/DFT.2016.7684077

Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

6 Citations (Scopus)

1 Downloads (Pure)

Abstract

Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments could be used for managing the lifetime dependability of the chips. The IEEE 1687 (iJTAG) standard introduces an access network to the instruments based on reconfigurable scan paths. During lifetime, instruments could be required to initiate communication with a system-level dependability manager for different reasons. For example, fault/event occurrences or measurement read-out requests; however iJTAG networks are inherently master/slave networks, where the instruments are the network slaves. In this work, a scalable interrupts-management methodology is presented for allowing instruments-initiated communication using hierarchical iJTAG networks. The presented method allows for an efficient access of the network according to the required use-case by allowing the network to be configured into a corresponding optimized mode. In addition, a novel on-chip localization methodology is presented, which significantly reduces the localization time of interrupting instruments as compared to previous works.

Original language	Undefined
Title of host publication	2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Place of Publication	USA
Publisher	IEEE Computer Society
Pages	97-102
Number of pages	6
ISBN (Print)	978-1-5090-3623-3
DOIs	https://doi.org/10.1109/DFT.2016.7684077
Publication status	Published - 19 Sep 2016
Event	2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 - University of Connecticut, Storrs, United States Duration: 19 Sep 2016 → 20 Sep 2016

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Abbreviated title	DFT
Country	United States
City	Storrs
Period	19/09/16 → 20/09/16

Keywords

EWI-27352
METIS-318573
IR-101897

Access to Document

10.1109/DFT.2016.7684077

Cite this

Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 97-102). USA: IEEE Computer Society. https://doi.org/10.1109/DFT.2016.7684077

@inproceedings{2c7b973f078f487d8dbca071316c4433,

title = "Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management",

abstract = "Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments could be used for managing the lifetime dependability of the chips. The IEEE 1687 (iJTAG) standard introduces an access network to the instruments based on reconfigurable scan paths. During lifetime, instruments could be required to initiate communication with a system-level dependability manager for different reasons. For example, fault/event occurrences or measurement read-out requests; however iJTAG networks are inherently master/slave networks, where the instruments are the network slaves. In this work, a scalable interrupts-management methodology is presented for allowing instruments-initiated communication using hierarchical iJTAG networks. The presented method allows for an efficient access of the network according to the required use-case by allowing the network to be configured into a corresponding optimized mode. In addition, a novel on-chip localization methodology is presented, which significantly reduces the localization time of interrupting instruments as compared to previous works.",

keywords = "EWI-27352, METIS-318573, IR-101897",

author = "Ibrahim, {Ahmed Mohammed Youssef} and Kerkhoff, {Hans G.}",

note = "eemcs-eprint-27352",

year = "2016",

month = "9",

day = "19",

doi = "10.1109/DFT.2016.7684077",

language = "Undefined",

isbn = "978-1-5090-3623-3",

publisher = "IEEE Computer Society",

pages = "97--102",

booktitle = "2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)",

address = "United States",

}

Ibrahim, AMY & Kerkhoff, HG 2016, Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. in 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE Computer Society, USA, pp. 97-102, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, United States, 19/09/16. https://doi.org/10.1109/DFT.2016.7684077

Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.

2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). USA : IEEE Computer Society, 2016. p. 97-102.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management

AU - Ibrahim, Ahmed Mohammed Youssef

AU - Kerkhoff, Hans G.

N1 - eemcs-eprint-27352

PY - 2016/9/19

Y1 - 2016/9/19

N2 - Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments could be used for managing the lifetime dependability of the chips. The IEEE 1687 (iJTAG) standard introduces an access network to the instruments based on reconfigurable scan paths. During lifetime, instruments could be required to initiate communication with a system-level dependability manager for different reasons. For example, fault/event occurrences or measurement read-out requests; however iJTAG networks are inherently master/slave networks, where the instruments are the network slaves. In this work, a scalable interrupts-management methodology is presented for allowing instruments-initiated communication using hierarchical iJTAG networks. The presented method allows for an efficient access of the network according to the required use-case by allowing the network to be configured into a corresponding optimized mode. In addition, a novel on-chip localization methodology is presented, which significantly reduces the localization time of interrupting instruments as compared to previous works.

AB - Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments could be used for managing the lifetime dependability of the chips. The IEEE 1687 (iJTAG) standard introduces an access network to the instruments based on reconfigurable scan paths. During lifetime, instruments could be required to initiate communication with a system-level dependability manager for different reasons. For example, fault/event occurrences or measurement read-out requests; however iJTAG networks are inherently master/slave networks, where the instruments are the network slaves. In this work, a scalable interrupts-management methodology is presented for allowing instruments-initiated communication using hierarchical iJTAG networks. The presented method allows for an efficient access of the network according to the required use-case by allowing the network to be configured into a corresponding optimized mode. In addition, a novel on-chip localization methodology is presented, which significantly reduces the localization time of interrupting instruments as compared to previous works.

KW - EWI-27352

KW - METIS-318573

KW - IR-101897

U2 - 10.1109/DFT.2016.7684077

DO - 10.1109/DFT.2016.7684077

M3 - Conference contribution

SN - 978-1-5090-3623-3

SP - 97

EP - 102

BT - 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

PB - IEEE Computer Society

CY - USA

ER -