Elastic Minutiae Matching by Means of Thin-Plate Spline Models

A.M. Bazen, Sabih H. Gerez

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    22 Citations (Scopus)
    66 Downloads (Pure)

    Abstract

    This paper presents a novel minutiae matching method that deals with elastic distortions by normalizing the shape of the test fingerprint with respect to the template. The method first determines possible matching minutiae pairs by means of comparing local neighborhoods of the minutiae. Next a thin-plate spline model is used to describe the non-linear distortions between the two sets of possible pairs. One of the fingerprints is deformed and registered according to the estimated model, and then the number of matching minutiae is counted. This method is able to deal with all possible non-linear distortions while using very tight bounding boxes. For deformed fingerprints, the algorithm gives considerably higher matching scores compared to rigid matching algorithms, while only taking 100 ms on a 1 GHz P-III machine.
    Original languageUndefined
    Title of host publicationProceedings of the International Conference on Pattern Recognition (ICPR)
    Place of PublicationQuebec City, Canada
    PublisherIEEE
    Pages-
    Number of pages4
    ISBN (Print)0-7695-1699-8
    DOIs
    Publication statusPublished - 11 Aug 2002
    Event16th International Conference on Pattern Recognition 2002 - Danvers, Canada, Quebec City, Canada
    Duration: 11 Aug 200215 Aug 2002
    Conference number: 16

    Publication series

    Name
    PublisherIEEE
    Volume2

    Conference

    Conference16th International Conference on Pattern Recognition 2002
    Abbreviated titleICPR 2002
    CountryCanada
    CityQuebec City
    Period11/08/0215/08/02
    Other11-15 Aug. 2002

    Keywords

    • Nonlinear distortion
    • splines (mathematics)
    • image matching
    • METIS-207588
    • IR-43864
    • Image registration
    • Fingerprint identification

    Cite this

    Bazen, A. M., & Gerez, S. H. (2002). Elastic Minutiae Matching by Means of Thin-Plate Spline Models. In Proceedings of the International Conference on Pattern Recognition (ICPR) (pp. -). Quebec City, Canada: IEEE. https://doi.org/10.1109/ICPR.2002.1048471