Abstract
This paper presents a novel minutiae matching method that deals with elastic distortions by normalizing the shape of the test fingerprint with respect to the template. The method first determines possible matching minutiae pairs by means of comparing local neighborhoods of the minutiae. Next a thin-plate spline model is used to describe the non-linear distortions between the two sets of possible pairs. One of the fingerprints is deformed and registered according to the estimated model, and then the number of matching minutiae is counted. This method is able to deal with all possible non-linear distortions while using very tight bounding boxes. For deformed fingerprints, the algorithm gives considerably higher matching scores compared to rigid matching algorithms, while only taking 100 ms on a 1 GHz P-III machine.
Original language | Undefined |
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Title of host publication | Proceedings of the International Conference on Pattern Recognition (ICPR) |
Place of Publication | Quebec City, Canada |
Publisher | IEEE |
Pages | - |
Number of pages | 4 |
ISBN (Print) | 0-7695-1699-8 |
DOIs | |
Publication status | Published - 11 Aug 2002 |
Event | 16th International Conference on Pattern Recognition 2002 - Danvers, Canada, Quebec City, Canada Duration: 11 Aug 2002 → 15 Aug 2002 Conference number: 16 |
Publication series
Name | |
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Publisher | IEEE |
Volume | 2 |
Conference
Conference | 16th International Conference on Pattern Recognition 2002 |
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Abbreviated title | ICPR 2002 |
Country | Canada |
City | Quebec City |
Period | 11/08/02 → 15/08/02 |
Other | 11-15 Aug. 2002 |
Keywords
- Nonlinear distortion
- splines (mathematics)
- image matching
- METIS-207588
- IR-43864
- Image registration
- Fingerprint identification