Electric noise in a TES as a resistively shunted conducting junction

A.G. Kozorezov, Alexandre Avraamovitch Golubov, D. Martin, P.A.J. de Korte, M.A. Lindeman, R.A. Hijmering, J. van der Kuur, H.F.C. Hoevers, L. Gottardi, M..Y. Kupriyanov, J.K. Wigmore

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)
4 Downloads (Pure)


We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium
Original languageUndefined
Pages (from-to)108-113
JournalJournal of low temperature physics
Issue number3-4
Publication statusPublished - 2012


  • IR-82265
  • METIS-289335

Cite this