Electric noise in a TES as a resistively shunted conducting junction

A.G. Kozorezov; A.A. Golubov; D.D.E. Martin; P.A.J. de Korte; M.A. Lindeman; R.A. Hijmering; J. van der Kuur; H.F.C. Hoevers; L. Gottardi; M.Y. Kupriyanov; J.K. Wigmore

doi:10.1007/s10909-012-0489-7

Electric noise in a TES as a resistively shunted conducting junction

A.G. Kozorezov
, A.A. Golubov
, D.D.E. Martin
, P.A.J. de Korte
, M.A. Lindeman
, R.A. Hijmering
, J. van der Kuur
, H.F.C. Hoevers
, L. Gottardi
, M.Y. Kupriyanov
, J.K. Wigmore

Research output: Contribution to journal › Article › Academic › peer-review

12 Citations (Scopus)

14 Downloads (Pure)

Abstract

We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium

Original language	English
Pages (from-to)	108-113
Journal	Journal of low temperature physics
Volume	167
Issue number	3-4
DOIs	https://doi.org/10.1007/s10909-012-0489-7
Publication status	Published - 2012

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2020 OA procedure

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10.1007/s10909-012-0489-7

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title = "Electric noise in a TES as a resistively shunted conducting junction",

abstract = "We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium",

keywords = "2020 OA procedure",

author = "A.G. Kozorezov and A.A. Golubov and D.D.E. Martin and \{de Korte\}, P.A.J. and M.A. Lindeman and R.A. Hijmering and \{van der Kuur\}, J. and H.F.C. Hoevers and L. Gottardi and M.Y. Kupriyanov and J.K. Wigmore",

year = "2012",

doi = "10.1007/s10909-012-0489-7",

language = "English",

volume = "167",

pages = "108--113",

journal = "Journal of low temperature physics",

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TY - JOUR

T1 - Electric noise in a TES as a resistively shunted conducting junction

AU - Kozorezov, A.G.

AU - Golubov, A.A.

AU - Martin, D.D.E.

AU - de Korte, P.A.J.

AU - Lindeman, M.A.

AU - Hijmering, R.A.

AU - van der Kuur, J.

AU - Hoevers, H.F.C.

AU - Gottardi, L.

AU - Kupriyanov, M.Y.

AU - Wigmore, J.K.

PY - 2012

Y1 - 2012

N2 - We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium

AB - We present results of the analysis of electrical noise in a transition edge sensor (TES) as a resistively shunted conducting junction (the RSJ model). We derive an expression for the spectral density of voltage fluctuations taking into account weak superconductivity of a TES. We analyse and discuss differences in voltage noise in a TES compared to the familiar situation for the Josephson junction. The spectral density of voltage noise in the RSJ model has a unique analytical structure and cannot be reduced to the expression for the nonlinear Johnson noise near equilibrium

KW - 2020 OA procedure

U2 - 10.1007/s10909-012-0489-7

DO - 10.1007/s10909-012-0489-7

M3 - Article

SN - 0022-2291

VL - 167

SP - 108

EP - 113

JO - Journal of low temperature physics

JF - Journal of low temperature physics

IS - 3-4

ER -

Electric noise in a TES as a resistively shunted conducting junction

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