Electric noise in a TES as a resistively shunted conducting junction

A.G. Kozorezov, Alexandre Avraamovitch Golubov, D. Martin, P.A.J. de Korte, M.A. Lindeman, R.A. Hijmering, J. van der Kuur, H.F.C. Hoevers, L. Gottardi, M..Y. Kupriyanov, J.K. Wigmore

Research output: Contribution to journal › Article › Academic › peer-review

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