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Electrical and 850 nm Optical Characterization of Back-Gate Controlled 22 nm FDSOI PIN-Diodes Without Front-Gate
Jelle H.T. Bakker, Marcin Ł. Motycki, Raymond J.E. Hueting, Anne-Johan Annema, Mark S. Oude Alink
Research output: Contribution to journal › Article › Academic › peer-review
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