Electrical and structural characterization of PLD grown CeO2-HfO2 laminated high-k gate dielectrics

K. Karakaya, B. Barcones Campo, Z.M. Rittersma, J.G.M. van Berkum, M.A. Verheijen, Augustinus J.H.M. Rijnders, David H.A. Blank

Research output: Contribution to journal › Article › Academic › peer-review

11 Citations (Scopus)
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