Electrical transport properties of oligothiophene based molecular films studied by current sensing Atomic Force Microscopy

Bas L.M. Hendriksen, Florent Martin, Yabing Qi, Y. Qi, Clayton Mauldin, Nenad Vukmirovic, JunFeng Ren, Herbert Wormeester, Allard J. Katan, Virginia Altoe, Shaul Aloni, Jean M.J. Frechet, Lin-Wang Wang, Miquel Salmeron

Research output: Contribution to journalArticleAcademicpeer-review

30 Citations (Scopus)

Abstract

Using conducting probe atomic force microscopy (CAFM) we have investigated the electrical conduction properties of monolayer films of a pentathiophene derivative on a SiO2/Si-p+ substrate. By a combination of current–voltage spectroscopy and current imaging we show that lateral charge transport takes place in the plane of the monolayer via hole injection into the highest occupied molecular orbitals of the pentathiophene unit. Our CAFM data suggest that the conductivity is anisotropic relative to the crystalline directions of the molecular lattice
Original languageEnglish
Pages (from-to)4107-4112
Number of pages5
JournalNano letters
Volume11
Issue number10
DOIs
Publication statusPublished - 2011

Keywords

  • Molecular electronics
  • Langmuir−Blodgett monolayer
  • Oligothiophene
  • IR-80447
  • lateral transport
  • conduction anisotropy
  • METIS-281089
  • current sensing atomic force microscopy

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    Hendriksen, B. L. M., Martin, F., Qi, Y., Qi, Y., Mauldin, C., Vukmirovic, N., ... Salmeron, M. (2011). Electrical transport properties of oligothiophene based molecular films studied by current sensing Atomic Force Microscopy. Nano letters, 11(10), 4107-4112. https://doi.org/10.1021/nl202720y