Electro-thermomogration-induced in power IC metallization

Van Hieu Nguyen, Cora Salm, J. Vroemen, B.H. Krabbenborg, J. Bisschop, A.J. Mouthaan, F.G. Kuper

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 16 Dec 2003
    EventFOM dagen 2003 - Veldhoven, Netherlands
    Duration: 17 Nov 200318 Nov 2003

    Conference

    ConferenceFOM dagen 2003
    CountryNetherlands
    CityVeldhoven
    Period17/11/0318/11/03

    Keywords

    • METIS-213261

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