Electromigration early resistance increase measurements

J. Niehof, P.A. Flinn, T.J. Maloney

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationConference Proceedings ESREF 92
    Subtitle of host publication3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992
    Place of PublicationBerlin, Germany
    PublisherVDE Verlag
    Publication statusPublished - 5 Oct 1992


    • METIS-113924

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