Electromigration early resistance increase measurements

J. Niehof; P.A. Flinn; T.J. Maloney

Electromigration early resistance increase measurements

J. Niehof, P.A. Flinn, T.J. Maloney

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Conference Proceedings ESREF 92
Subtitle of host publication	3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992
Place of Publication	Berlin, Germany
Publisher	VDE Verlag
Pages	359-362
Publication status	Published - 5 Oct 1992

Keywords

METIS-113924

Cite this

@inproceedings{55b3bc2de28d4737be7cf91684b2162b,

title = "Electromigration early resistance increase measurements",

keywords = "METIS-113924",

author = "J. Niehof and P.A. Flinn and T.J. Maloney",

year = "1992",

month = oct,

day = "5",

language = "English",

pages = "359--362",

booktitle = "Conference Proceedings ESREF 92",

publisher = "VDE Verlag",

address = "Germany",

}

Electromigration early resistance increase measurements. / Niehof, J.; Flinn, P.A.; Maloney, T.J.
Conference Proceedings ESREF 92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992. Berlin, Germany: VDE Verlag, 1992. p. 359-362.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review