Electromigration early resistance increase measurements

J. Niehof, P.A. Flinn, T.J. Maloney

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationConference Proceedings ESREF 92
    Subtitle of host publication3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992
    Place of PublicationBerlin, Germany
    PublisherVDE Verlag
    Pages359-362
    Publication statusPublished - 5 Oct 1992

    Keywords

    • METIS-113924

    Cite this

    Niehof, J., Flinn, P. A., & Maloney, T. J. (1992). Electromigration early resistance increase measurements. In Conference Proceedings ESREF 92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992 (pp. 359-362). Berlin, Germany: VDE Verlag.
    Niehof, J. ; Flinn, P.A. ; Maloney, T.J. / Electromigration early resistance increase measurements. Conference Proceedings ESREF 92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992. Berlin, Germany : VDE Verlag, 1992. pp. 359-362
    @inproceedings{55b3bc2de28d4737be7cf91684b2162b,
    title = "Electromigration early resistance increase measurements",
    keywords = "METIS-113924",
    author = "J. Niehof and P.A. Flinn and T.J. Maloney",
    year = "1992",
    month = "10",
    day = "5",
    language = "English",
    pages = "359--362",
    booktitle = "Conference Proceedings ESREF 92",
    publisher = "VDE Verlag",

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    Niehof, J, Flinn, PA & Maloney, TJ 1992, Electromigration early resistance increase measurements. in Conference Proceedings ESREF 92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992. VDE Verlag, Berlin, Germany, pp. 359-362.

    Electromigration early resistance increase measurements. / Niehof, J.; Flinn, P.A.; Maloney, T.J.

    Conference Proceedings ESREF 92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992. Berlin, Germany : VDE Verlag, 1992. p. 359-362.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Electromigration early resistance increase measurements

    AU - Niehof, J.

    AU - Flinn, P.A.

    AU - Maloney, T.J.

    PY - 1992/10/5

    Y1 - 1992/10/5

    KW - METIS-113924

    M3 - Conference contribution

    SP - 359

    EP - 362

    BT - Conference Proceedings ESREF 92

    PB - VDE Verlag

    CY - Berlin, Germany

    ER -

    Niehof J, Flinn PA, Maloney TJ. Electromigration early resistance increase measurements. In Conference Proceedings ESREF 92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwabisch Gmund, Germany, 5-8 October 1992. Berlin, Germany: VDE Verlag. 1992. p. 359-362