Electromigration reliability simulator

J. Niehof, D.C.L. van Geest, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings Symposium Materials Research Society, Vol. 265
Place of Publication	San Francisco
Pages	51-56
Number of pages	0
Publication status	Published - 27 Apr 1992

Keywords

@inproceedings{a8a5d709de7e471eb4da777193f04d25,

title = "Electromigration reliability simulator",

keywords = "METIS-113925",

author = "J. Niehof and {van Geest}, D.C.L. and J.F. Verweij",

year = "1992",

month = apr,

day = "27",

language = "Undefined",

pages = "51--56",

booktitle = "Proceedings Symposium Materials Research Society, Vol. 265",

}