Electromigration reliability simulator

J. Niehof, D.C.L. van Geest, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Materials Research Society, 1992 Spring Meeting
Place of Publication	San Francisco, USA
Pages	51-56
Number of pages	6
Publication status	Published - 17 Apr 1992

Keywords

@inproceedings{ef399e4f991a4c1f93a51bbfb9aa6887,

title = "Electromigration reliability simulator",

keywords = "METIS-113097",

author = "J. Niehof and {van Geest}, D.C.L. and J.F. Verweij",

year = "1992",

month = apr,

day = "17",

language = "Undefined",

isbn = "1-55899-160-3",

pages = "51--56",

booktitle = "Materials Research Society, 1992 Spring Meeting",

}