Electromigration reliability simulator

J. Niehof, D.C.L. van Geest, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationMaterials Research Society, 1992 Spring Meeting
    Place of PublicationSan Francisco, USA
    Pages51-56
    Number of pages6
    Publication statusPublished - 17 Apr 1992

    Keywords

    • METIS-113097

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