Electromigration simulations in 2D metallization structures

J. Niehof, P.B.M. Wolbert, A.J. Mouthaan, J.F. Verweij

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 19 Nov 1991
    EventIOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands
    Duration: 19 Nov 199120 Nov 1991

    Conference

    ConferenceIOP/FOM Werkgemeenschap Halfgeleiders 1991
    CountryNetherlands
    CityVeldhoven
    Period19/11/9120/11/91

    Keywords

    • METIS-117289

    Cite this

    Niehof, J., Wolbert, P. B. M., Mouthaan, A. J., & Verweij, J. F. (1991). Electromigration simulations in 2D metallization structures. -. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.