Electromigration simulations in 2D metallization structures

J. Niehof, P.B.M. Wolbert, A.J. Mouthaan, J.F. Verweij

Research output: Contribution to conference › Poster › Other research output

Original language	English
Pages	-
Publication status	Published - 19 Nov 1991
Event	IOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands Duration: 19 Nov 1991 → 20 Nov 1991

Conference	IOP/FOM Werkgemeenschap Halfgeleiders 1991
Country/Territory	Netherlands
City	Veldhoven
Period	19/11/91 → 20/11/91

Keywords

@conference{4f9a68a5751842a3a40a368ab0c71252,

title = "Electromigration simulations in 2D metallization structures",

keywords = "METIS-117289",

author = "J. Niehof and P.B.M. Wolbert and A.J. Mouthaan and J.F. Verweij",

year = "1991",

month = nov,

day = "19",

language = "English",

pages = "--",

note = "IOP/FOM Werkgemeenschap Halfgeleiders 1991 ; Conference date: 19-11-1991 Through 20-11-1991",

}