Electrostatic discharge in integrated circuits; testing and protection

J.R.M. Luchies

    Research output: Thesis › PhD Thesis - Research UT, graduation UT › Academic

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Verweij, J.F., Supervisor
    • Mouthaan, A.J., Advisor
    Award date1 Sep 1995
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9008517-3
    Publication statusPublished - 1 Sep 1995

    Keywords

    • METIS-111440

    Cite this

    Luchies, J. R. M. (1995). Electrostatic discharge in integrated circuits; testing and protection. Enschede: Universiteit Twente.
    Luchies, J.R.M.. / Electrostatic discharge in integrated circuits; testing and protection. Enschede : Universiteit Twente, 1995. 138 p.
    @phdthesis{11fbda01912e42178bcbbc8d6a65aa1a,
    title = "Electrostatic discharge in integrated circuits; testing and protection",
    keywords = "METIS-111440",
    author = "J.R.M. Luchies",
    year = "1995",
    month = "9",
    day = "1",
    language = "Undefined",
    isbn = "90-9008517-3",
    publisher = "Universiteit Twente",
    school = "University of Twente",

    }

    Luchies, JRM 1995, 'Electrostatic discharge in integrated circuits; testing and protection', University of Twente, Enschede.

    Electrostatic discharge in integrated circuits; testing and protection. / Luchies, J.R.M.

    Enschede : Universiteit Twente, 1995. 138 p.

    Research output: Thesis › PhD Thesis - Research UT, graduation UT › Academic

    TY - THES

    T1 - Electrostatic discharge in integrated circuits; testing and protection

    AU - Luchies, J.R.M.

    PY - 1995/9/1

    Y1 - 1995/9/1

    KW - METIS-111440

    M3 - PhD Thesis - Research UT, graduation UT

    SN - 90-9008517-3

    PB - Universiteit Twente

    CY - Enschede

    ER -

    Luchies JRM. Electrostatic discharge in integrated circuits; testing and protection. Enschede: Universiteit Twente, 1995. 138 p.