Electrostatic Discharge Induced Degradation in Top Gate Amorphous Silicon Thin Film Transistors

N. Golo-Tosic, F.G. Kuper, A.J. Mouthaan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{235ce004812a43d1832ea41ff7e75a53,

title = "Electrostatic Discharge Induced Degradation in Top Gate Amorphous Silicon Thin Film Transistors",

keywords = "METIS-113914",

author = "N. Golo-Tosic and F.G. Kuper and A.J. Mouthaan",

year = "1999",

month = nov,

day = "24",

language = "Undefined",

isbn = "90-73461-18-9",

pages = "515--520",

booktitle = "SAFE'99",

}