Electrothermal effects in bipolar differential pairs

L. La Spina; V. D'Alessandro; F. Santagata; N. Rinaldi; L. K. Nanver

doi:10.1109/BIPOL.2007.4351853

Electrothermal effects in bipolar differential pairs

L. La Spina^*, V. D'Alessandro, F. Santagata, N. Rinaldi, L. K. Nanver

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

8 Citations (Scopus)

Abstract

The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.

Original language	English
Title of host publication	Proceedings of the 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Pages	131-134
Number of pages	4
DOIs	https://doi.org/10.1109/BIPOL.2007.4351853
Publication status	Published - 1 Dec 2007
Externally published	Yes
Event	IEEE Bipolar/BiCMOS Circuits and Technology Meeting 2007 - Boston, MA, United States Duration: 30 Sept 2007 → 2 Oct 2007 https://bcicts.org/

Conference

Conference	IEEE Bipolar/BiCMOS Circuits and Technology Meeting 2007
Abbreviated title	BCTM 2007
Country/Territory	United States
City	Boston, MA
Period	30/09/07 → 2/10/07
Internet address	https://bcicts.org/

Keywords

Analog circuits
Bipolar Junction Transistor (BJT)
Differential pair
Electrothermal analysis
Silicon-on-glass
Thermal instability

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10.1109/BIPOL.2007.4351853

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title = "Electrothermal effects in bipolar differential pairs",

abstract = "The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.",

keywords = "Analog circuits, Bipolar Junction Transistor (BJT), Differential pair, Electrothermal analysis, Silicon-on-glass, Thermal instability",

author = "{La Spina}, L. and V. D'Alessandro and F. Santagata and N. Rinaldi and Nanver, {L. K.}",

year = "2007",

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doi = "10.1109/BIPOL.2007.4351853",

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pages = "131--134",

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TY - GEN

T1 - Electrothermal effects in bipolar differential pairs

AU - La Spina, L.

AU - D'Alessandro, V.

AU - Santagata, F.

AU - Rinaldi, N.

AU - Nanver, L. K.

PY - 2007/12/1

Y1 - 2007/12/1

N2 - The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.

AB - The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.

KW - Analog circuits

KW - Bipolar Junction Transistor (BJT)

KW - Differential pair

KW - Electrothermal analysis

KW - Silicon-on-glass

KW - Thermal instability

UR - http://www.scopus.com/inward/record.url?scp=39049170029&partnerID=8YFLogxK

U2 - 10.1109/BIPOL.2007.4351853

DO - 10.1109/BIPOL.2007.4351853

M3 - Conference contribution

AN - SCOPUS:39049170029

SN - 9781424410194

SP - 131

EP - 134

BT - Proceedings of the 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting

T2 - IEEE Bipolar/BiCMOS Circuits and Technology Meeting 2007

Y2 - 30 September 2007 through 2 October 2007

ER -

Electrothermal effects in bipolar differential pairs

Abstract

Conference

Keywords

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