Electrothermal effects in bipolar differential pairs

L. La Spina*, V. D'Alessandro, F. Santagata, N. Rinaldi, L. K. Nanver

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Abstract

The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.

Original languageEnglish
Title of host publicationProceedings of the 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Pages131-134
Number of pages4
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
EventIEEE Bipolar/BiCMOS Circuits and Technology Meeting 2007 - Boston, MA, United States
Duration: 30 Sep 20072 Oct 2007
https://bcicts.org/

Conference

ConferenceIEEE Bipolar/BiCMOS Circuits and Technology Meeting 2007
Abbreviated titleBCTM 2007
CountryUnited States
CityBoston, MA
Period30/09/072/10/07
Internet address

Keywords

  • Analog circuits
  • Bipolar Junction Transistor (BJT)
  • Differential pair
  • Electrothermal analysis
  • Silicon-on-glass
  • Thermal instability

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    La Spina, L., D'Alessandro, V., Santagata, F., Rinaldi, N., & Nanver, L. K. (2007). Electrothermal effects in bipolar differential pairs. In Proceedings of the 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (pp. 131-134). [4351853] https://doi.org/10.1109/BIPOL.2007.4351853