Ellipsometric studies on c-axis oriented high-Tc superconducting YBa2Cu3O7-x thin films; thickness measurements and oxygen out-diffusion experiments

W.A.M. Aarnink; R.P.J. IJsselsteijn; J. Gao; A. van Silfhout; H. Rogalla

doi:10.1016/B978-0-444-89353-6.50012-9

Ellipsometric studies on c-axis oriented high-T_c superconducting YBa₂Cu₃O_7-x thin films; thickness measurements and oxygen out-diffusion experiments

W.A.M. Aarnink, R.P.J. IJsselsteijn, J. Gao, A. van Silfhout, H. Rogalla

Physics of Interfaces and Nanomaterials

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Original language	English
Title of host publication	High Tc Superconductor Thin Films
Subtitle of host publication	International Conference on Advanced Materials - ICAM '91
Editors	L. Correra
Place of Publication	Amsterdam
Publisher	Elsevier
Pages	49-54
Number of pages	6
ISBN (Electronic)	978-0-444-60025-7
ISBN (Print)	978-0-444-89353-6
DOIs	https://doi.org/10.1016/B978-0-444-89353-6.50012-9
Publication status	Published - 1992
Event	International Conference on Advanced Materials, ICAM 1991 - Strasbourg, France Duration: 27 May 1991 → 31 May 1991

Conference

Conference	International Conference on Advanced Materials, ICAM 1991
Abbreviated title	ICAM
Country/Territory	France
City	Strasbourg
Period	27/05/91 → 31/05/91

Access to Document

10.1016/B978-0-444-89353-6.50012-9

Cite this

Aarnink, W. A. M., IJsselsteijn, R. P. J., Gao, J., van Silfhout, A., & Rogalla, H. (1992). Ellipsometric studies on c-axis oriented high-T_c superconducting YBa₂Cu₃O_7-x thin films; thickness measurements and oxygen out-diffusion experiments. In L. Correra (Ed.), High Tc Superconductor Thin Films: International Conference on Advanced Materials - ICAM '91 (pp. 49-54). Elsevier. https://doi.org/10.1016/B978-0-444-89353-6.50012-9

@inproceedings{6b408e8dcbb64505a55616de6731c58b,

title = "Ellipsometric studies on c-axis oriented high-Tc superconducting YBa2Cu3O7-x thin films; thickness measurements and oxygen out-diffusion experiments",

author = "W.A.M. Aarnink and R.P.J. IJsselsteijn and J. Gao and {van Silfhout}, A. and H. Rogalla",

year = "1992",

doi = "10.1016/B978-0-444-89353-6.50012-9",

language = "English",

isbn = "978-0-444-89353-6",

pages = "49--54",

editor = "L. Correra",

booktitle = "High Tc Superconductor Thin Films",

publisher = "Elsevier",

note = "International Conference on Advanced Materials, ICAM 1991, ICAM ; Conference date: 27-05-1991 Through 31-05-1991",

}

Aarnink, WAM, IJsselsteijn, RPJ, Gao, J, van Silfhout, A & Rogalla, H 1992, Ellipsometric studies on c-axis oriented high-T_c superconducting YBa₂Cu₃O_7-x thin films; thickness measurements and oxygen out-diffusion experiments. in L Correra (ed.), High Tc Superconductor Thin Films: International Conference on Advanced Materials - ICAM '91. Elsevier, Amsterdam, pp. 49-54, International Conference on Advanced Materials, ICAM 1991, Strasbourg, France, 27/05/91. https://doi.org/10.1016/B978-0-444-89353-6.50012-9

Ellipsometric studies on c-axis oriented high-T_c superconducting YBa₂Cu₃O_7-x thin films; thickness measurements and oxygen out-diffusion experiments. / Aarnink, W.A.M.; IJsselsteijn, R.P.J.; Gao, J. et al.
High Tc Superconductor Thin Films: International Conference on Advanced Materials - ICAM '91. ed. / L. Correra. Amsterdam: Elsevier, 1992. p. 49-54.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Ellipsometric studies on c-axis oriented high-Tc superconducting YBa2Cu3O7-x thin films; thickness measurements and oxygen out-diffusion experiments

AU - Aarnink, W.A.M.

AU - IJsselsteijn, R.P.J.

AU - Gao, J.

AU - van Silfhout, A.

AU - Rogalla, H.

PY - 1992

Y1 - 1992

U2 - 10.1016/B978-0-444-89353-6.50012-9

DO - 10.1016/B978-0-444-89353-6.50012-9

M3 - Conference contribution

SN - 978-0-444-89353-6

SP - 49

EP - 54

BT - High Tc Superconductor Thin Films

A2 - Correra, L.

PB - Elsevier

CY - Amsterdam

T2 - International Conference on Advanced Materials, ICAM 1991

Y2 - 27 May 1991 through 31 May 1991

ER -

Aarnink WAM, IJsselsteijn RPJ, Gao J, van Silfhout A, Rogalla H. Ellipsometric studies on c-axis oriented high-T_c superconducting YBa₂Cu₃O_7-x thin films; thickness measurements and oxygen out-diffusion experiments. In Correra L, editor, High Tc Superconductor Thin Films: International Conference on Advanced Materials - ICAM '91. Amsterdam: Elsevier. 1992. p. 49-54 doi: 10.1016/B978-0-444-89353-6.50012-9