Ellipsometric study of Si MBE on Si(001)2x1 surfaces

L.C. Jorritsma; Henricus J.W. Zandvliet; Herbert Wormeester; H.J.M. Oerbekke; Arend van Silfhout; I. Koval; Enrico G. Keim; T. Kachlicki

Ellipsometric study of Si MBE on Si(001)2x1 surfaces

L.C. Jorritsma, Henricus J.W. Zandvliet, Herbert Wormeester, H.J.M. Oerbekke, Arend van Silfhout, I. Koval, Enrico G. Keim, T. Kachlicki

Physics of Interfaces and Nanomaterials

Research output: Contribution to conference › Poster › Other research output

Original language	English
Number of pages	1
Publication status	Published - 18 Nov 1993
Event	FOM Werkgemeenschap Halfgeleiders 1993 - Veldhoven, Netherlands Duration: 17 Nov 1993 → 18 Nov 1993

Conference

Conference	FOM Werkgemeenschap Halfgeleiders 1993
Country/Territory	Netherlands
City	Veldhoven
Period	17/11/93 → 18/11/93

Cite this

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title = "Ellipsometric study of Si MBE on Si(001)2x1 surfaces",

author = "L.C. Jorritsma and Zandvliet, {Henricus J.W.} and Herbert Wormeester and H.J.M. Oerbekke and {van Silfhout}, Arend and I. Koval and Keim, {Enrico G.} and T. Kachlicki",

year = "1993",

month = nov,

day = "18",

language = "English",

note = "FOM Werkgemeenschap Halfgeleiders 1993 ; Conference date: 17-11-1993 Through 18-11-1993",

}

TY - CONF

T1 - Ellipsometric study of Si MBE on Si(001)2x1 surfaces

AU - Jorritsma, L.C.

AU - Zandvliet, Henricus J.W.

AU - Wormeester, Herbert

AU - Oerbekke, H.J.M.

AU - van Silfhout, Arend

AU - Koval, I.

AU - Keim, Enrico G.

AU - Kachlicki, T.

PY - 1993/11/18

Y1 - 1993/11/18

M3 - Poster

T2 - FOM Werkgemeenschap Halfgeleiders 1993

Y2 - 17 November 1993 through 18 November 1993

ER -