Ellipsometry based imaging techniques for nanoscale characterization of heterogeneous polymer films

Aysegul Cumurcu

Research output: ThesisPhD Thesis - Research UT, graduation UT

80 Downloads (Pure)

Abstract

In this thesis, hybrid methods for nanoscale characterization of heterogeneous thin polymer films were discussed. Essentially two ellipsometry based hybrid methods were established or further developed, respectively, namely electrochemical imaging ellipsometry (EC-IE) and scanning near field ellipsometry microscopy (SNEM). Ellipsometry was combined with electrochemical methods for the visualization of redox driven dynamic changes in thin polymer films. In particular, the redox responsive behaviour of an oligoethylene sulfide end-functionalized poly(ferrocenyldimethylsilane) (ES-PFS) film was investigated with this hybrid method against a passive (non-redoxactive) 11-mercapto-1- undecanol (MCU) layer. The thickness change of the PFS layer upon oxidation and the reduction was observed in situ in real time with EC-IE. This hybrid method provides vertical resolution at the sub nanometer scale while its lateral resolution is limited to the wavelength of the light source (λ=633 nm). In contrast, SNEM reveals lateral resolution below the diffraction limit of the light. The emphasis of the thesis was devoted to SNEM, including the introduction of the instrument, experimental case studies to enlighten its contrast formation and the optimization of the method. SNEM enables optical contrast imaging of thin transparent polymer films at the nanoscale due to the combination of the spatial tip-sample positioning capability of the atomic force microscopy (AFM) together with the high sensitivity of ellipsometry.
Original languageEnglish
Awarding Institution
  • University of Twente
Supervisors/Advisors
  • Vancso, Gyula J., Supervisor
  • Schön, Peter Manfred, Advisor
Award date26 Sep 2014
Place of PublicationEnschede
Publisher
Print ISBNs978-90-365-3740-7
DOIs
Publication statusPublished - 26 Sep 2014

Fingerprint

Ellipsometry
Polymer films
Imaging techniques
Scanning
Microscopic examination
Thin films
Sulfides
Optical microscopy
Light sources
Atomic force microscopy
Visualization
Diffraction
Wavelength
Oxidation

Keywords

  • IR-91870
  • METIS-305149

Cite this

Cumurcu, Aysegul. / Ellipsometry based imaging techniques for nanoscale characterization of heterogeneous polymer films. Enschede : Universiteit Twente, 2014. 148 p.
@phdthesis{fbea000d9e08403fb151fe1b88bc535f,
title = "Ellipsometry based imaging techniques for nanoscale characterization of heterogeneous polymer films",
abstract = "In this thesis, hybrid methods for nanoscale characterization of heterogeneous thin polymer films were discussed. Essentially two ellipsometry based hybrid methods were established or further developed, respectively, namely electrochemical imaging ellipsometry (EC-IE) and scanning near field ellipsometry microscopy (SNEM). Ellipsometry was combined with electrochemical methods for the visualization of redox driven dynamic changes in thin polymer films. In particular, the redox responsive behaviour of an oligoethylene sulfide end-functionalized poly(ferrocenyldimethylsilane) (ES-PFS) film was investigated with this hybrid method against a passive (non-redoxactive) 11-mercapto-1- undecanol (MCU) layer. The thickness change of the PFS layer upon oxidation and the reduction was observed in situ in real time with EC-IE. This hybrid method provides vertical resolution at the sub nanometer scale while its lateral resolution is limited to the wavelength of the light source (λ=633 nm). In contrast, SNEM reveals lateral resolution below the diffraction limit of the light. The emphasis of the thesis was devoted to SNEM, including the introduction of the instrument, experimental case studies to enlighten its contrast formation and the optimization of the method. SNEM enables optical contrast imaging of thin transparent polymer films at the nanoscale due to the combination of the spatial tip-sample positioning capability of the atomic force microscopy (AFM) together with the high sensitivity of ellipsometry.",
keywords = "IR-91870, METIS-305149",
author = "Aysegul Cumurcu",
year = "2014",
month = "9",
day = "26",
doi = "10.3990/1.9789036537407",
language = "English",
isbn = "978-90-365-3740-7",
publisher = "Universiteit Twente",
school = "University of Twente",

}

Ellipsometry based imaging techniques for nanoscale characterization of heterogeneous polymer films. / Cumurcu, Aysegul.

Enschede : Universiteit Twente, 2014. 148 p.

Research output: ThesisPhD Thesis - Research UT, graduation UT

TY - THES

T1 - Ellipsometry based imaging techniques for nanoscale characterization of heterogeneous polymer films

AU - Cumurcu, Aysegul

PY - 2014/9/26

Y1 - 2014/9/26

N2 - In this thesis, hybrid methods for nanoscale characterization of heterogeneous thin polymer films were discussed. Essentially two ellipsometry based hybrid methods were established or further developed, respectively, namely electrochemical imaging ellipsometry (EC-IE) and scanning near field ellipsometry microscopy (SNEM). Ellipsometry was combined with electrochemical methods for the visualization of redox driven dynamic changes in thin polymer films. In particular, the redox responsive behaviour of an oligoethylene sulfide end-functionalized poly(ferrocenyldimethylsilane) (ES-PFS) film was investigated with this hybrid method against a passive (non-redoxactive) 11-mercapto-1- undecanol (MCU) layer. The thickness change of the PFS layer upon oxidation and the reduction was observed in situ in real time with EC-IE. This hybrid method provides vertical resolution at the sub nanometer scale while its lateral resolution is limited to the wavelength of the light source (λ=633 nm). In contrast, SNEM reveals lateral resolution below the diffraction limit of the light. The emphasis of the thesis was devoted to SNEM, including the introduction of the instrument, experimental case studies to enlighten its contrast formation and the optimization of the method. SNEM enables optical contrast imaging of thin transparent polymer films at the nanoscale due to the combination of the spatial tip-sample positioning capability of the atomic force microscopy (AFM) together with the high sensitivity of ellipsometry.

AB - In this thesis, hybrid methods for nanoscale characterization of heterogeneous thin polymer films were discussed. Essentially two ellipsometry based hybrid methods were established or further developed, respectively, namely electrochemical imaging ellipsometry (EC-IE) and scanning near field ellipsometry microscopy (SNEM). Ellipsometry was combined with electrochemical methods for the visualization of redox driven dynamic changes in thin polymer films. In particular, the redox responsive behaviour of an oligoethylene sulfide end-functionalized poly(ferrocenyldimethylsilane) (ES-PFS) film was investigated with this hybrid method against a passive (non-redoxactive) 11-mercapto-1- undecanol (MCU) layer. The thickness change of the PFS layer upon oxidation and the reduction was observed in situ in real time with EC-IE. This hybrid method provides vertical resolution at the sub nanometer scale while its lateral resolution is limited to the wavelength of the light source (λ=633 nm). In contrast, SNEM reveals lateral resolution below the diffraction limit of the light. The emphasis of the thesis was devoted to SNEM, including the introduction of the instrument, experimental case studies to enlighten its contrast formation and the optimization of the method. SNEM enables optical contrast imaging of thin transparent polymer films at the nanoscale due to the combination of the spatial tip-sample positioning capability of the atomic force microscopy (AFM) together with the high sensitivity of ellipsometry.

KW - IR-91870

KW - METIS-305149

U2 - 10.3990/1.9789036537407

DO - 10.3990/1.9789036537407

M3 - PhD Thesis - Research UT, graduation UT

SN - 978-90-365-3740-7

PB - Universiteit Twente

CY - Enschede

ER -