Ellipsometry with an undetermined polarization state

Fenz Liu, Christopher James Lee, Juequan Chen, Eric Louis, Petrus J.M. van der Slot, Klaus J. Boller, Frederik Bijkerk

Research output: Contribution to conferencePosterOther research output


Highly accurate polarization-based measurements can be done without knowing the absolute polarization state of the probing light field. We demonstrate this approach by measuring Ellipsometric data of carbon thin films with high accuracy. OCIS codes: (120.2130) Ellipsometry and polarimetry, (060.2420) Fibers, polarization-maintaining, (060.2270) Fiber characterization, (340.7470) X-ray mirrors.
Original languageEnglish
Publication statusPublished - 6 May 2012
EventConference on Lasers and Electro-Optics, CLEO 2012 - San Jose McEnery Convention Center, San Jose, United States
Duration: 6 May 201211 May 2012


ConferenceConference on Lasers and Electro-Optics, CLEO 2012
Abbreviated titleCLEO
Country/TerritoryUnited States
CitySan Jose


  • METIS-294183


Dive into the research topics of 'Ellipsometry with an undetermined polarization state'. Together they form a unique fingerprint.

Cite this