Highly accurate polarization-based measurements can be done without knowing the absolute polarization state of the probing light field. We demonstrate this approach by measuring Ellipsometric data of carbon thin films with high accuracy. OCIS codes: (120.2130) Ellipsometry and polarimetry, (060.2420) Fibers, polarization-maintaining, (060.2270) Fiber characterization, (340.7470) X-ray mirrors.
|Publication status||Published - 6 May 2012|
|Event||Conference on Lasers and Electro-Optics, CLEO 2012 - San Jose McEnery Convention Center, San Jose, United States|
Duration: 6 May 2012 → 11 May 2012
|Conference||Conference on Lasers and Electro-Optics, CLEO 2012|
|Period||6/05/12 → 11/05/12|