Ellipsometry with random polarization state

Fenz Liu, B. van Albada, Christopher James Lee, Frederik Bijkerk

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 1 Jun 2012
Event	13th ASML TC Conference: Tertiary Ellipsometry with random polarization state - Veldhoven Duration: 16 Jan 2012 → …

Keywords

@conference{45dc14a5c8754b85b89011c68fa87714,

title = "Ellipsometry with random polarization state",

keywords = "METIS-298877",

author = "Fenz Liu and {van Albada}, B. and Lee, {Christopher James} and Frederik Bijkerk",

year = "2012",

month = jun,

day = "1",

language = "Undefined",

pages = "--",

note = "13th ASML TC Conference ; Conference date: 16-01-2012",

}