Embedded Analogue Core Testing in Silicon Systems

M. Stancic, L. Fang, R.M.W. Tijink, Marcel H.H. Weusthof, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 3rd Workshop on Embedded Systems (PROGRESS)
    Place of PublicationUtrecht, The Netherlands
    Pages230-238
    Number of pages9
    Publication statusPublished - 24 Oct 2002

    Keywords

    • METIS-207631

    Cite this

    Stancic, M., Fang, L., Tijink, R. M. W., Weusthof, M. H. H., & Kerkhoff, H. G. (2002). Embedded Analogue Core Testing in Silicon Systems. In Proceedings 3rd Workshop on Embedded Systems (PROGRESS) (pp. 230-238). Utrecht, The Netherlands.