Embedded Analogue Core Testing in Silicon Systems

M. Stancic, L. Fang, R.M.W. Tijink, Marcel H.H. Weusthof, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 3rd Workshop on Embedded Systems (PROGRESS)
    Place of PublicationUtrecht, The Netherlands
    Pages230-238
    Number of pages9
    Publication statusPublished - 24 Oct 2002

    Keywords

    • METIS-207631

    Cite this

    Stancic, M., Fang, L., Tijink, R. M. W., Weusthof, M. H. H., & Kerkhoff, H. G. (2002). Embedded Analogue Core Testing in Silicon Systems. In Proceedings 3rd Workshop on Embedded Systems (PROGRESS) (pp. 230-238). Utrecht, The Netherlands.
    Stancic, M. ; Fang, L. ; Tijink, R.M.W. ; Weusthof, Marcel H.H. ; Kerkhoff, Hans G. / Embedded Analogue Core Testing in Silicon Systems. Proceedings 3rd Workshop on Embedded Systems (PROGRESS). Utrecht, The Netherlands, 2002. pp. 230-238
    @inproceedings{0ffcc8d0baf54b458f7bd81825309780,
    title = "Embedded Analogue Core Testing in Silicon Systems",
    keywords = "METIS-207631",
    author = "M. Stancic and L. Fang and R.M.W. Tijink and Weusthof, {Marcel H.H.} and Kerkhoff, {Hans G.}",
    year = "2002",
    month = "10",
    day = "24",
    language = "Undefined",
    isbn = "90-73461-34-0",
    pages = "230--238",
    booktitle = "Proceedings 3rd Workshop on Embedded Systems (PROGRESS)",

    }

    Stancic, M, Fang, L, Tijink, RMW, Weusthof, MHH & Kerkhoff, HG 2002, Embedded Analogue Core Testing in Silicon Systems. in Proceedings 3rd Workshop on Embedded Systems (PROGRESS). Utrecht, The Netherlands, pp. 230-238.

    Embedded Analogue Core Testing in Silicon Systems. / Stancic, M.; Fang, L.; Tijink, R.M.W.; Weusthof, Marcel H.H.; Kerkhoff, Hans G.

    Proceedings 3rd Workshop on Embedded Systems (PROGRESS). Utrecht, The Netherlands, 2002. p. 230-238.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Embedded Analogue Core Testing in Silicon Systems

    AU - Stancic, M.

    AU - Fang, L.

    AU - Tijink, R.M.W.

    AU - Weusthof, Marcel H.H.

    AU - Kerkhoff, Hans G.

    PY - 2002/10/24

    Y1 - 2002/10/24

    KW - METIS-207631

    M3 - Conference contribution

    SN - 90-73461-34-0

    SP - 230

    EP - 238

    BT - Proceedings 3rd Workshop on Embedded Systems (PROGRESS)

    CY - Utrecht, The Netherlands

    ER -

    Stancic M, Fang L, Tijink RMW, Weusthof MHH, Kerkhoff HG. Embedded Analogue Core Testing in Silicon Systems. In Proceedings 3rd Workshop on Embedded Systems (PROGRESS). Utrecht, The Netherlands. 2002. p. 230-238