The idea of an embedded instrument (EI) is to embed some form of test and measurement into silicon to characterize, debug and test chips. The concept of the EI is different from build-in self test (BIST) and other kinds of monitors by the fact that embedded instruments can provide the user with rich and detailed information with respect to the performances of the target, not just a true/false indication. In this paper, two embedded instruments for analogue and mixed-signal IPs focusing on dependability applications are introduced. They are the EI for measuring MOS transistors' threshold voltage and the EI for testing OpAmps' gain and offset. Measurements as well as simulation results are provided to validate these EIs and show their efficiency in monitoring the ageing of analogue and mixed-signal IPs in their life time, and enable the path to enhance dependability.
|Publisher||IEEE Circuits & Systems Society|
|Conference||IEEE 13th International New Circuits and Systems Conference, NEWCAS 2015|
|Period||7/06/15 → 10/06/15|
|Other||7-10 June 2015|
- CAES-TDT: Testable Design and Test