Emperical Modeling of Electromigration Early Resistance Changes

J. Niehof, H.C. de Graaff, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings Materials Research Society, Materials Reliability in Microelectronics III
Place of Publication	San Fransisco, U.S.A.
Pages	295-300
Publication status	Published - 14 Dec 1993

Keywords

@inproceedings{c21feb4040b5422c9d4f503663f7b56e,

title = "Emperical Modeling of Electromigration Early Resistance Changes",

keywords = "METIS-113997",

author = "J. Niehof and \{de Graaff\}, H.C. and J.F. Verweij",

year = "1993",

month = dec,

day = "14",

language = "Undefined",

pages = "295--300",

booktitle = "Proceedings Materials Research Society, Materials Reliability in Microelectronics III",

}