Energy Migration Governs Upconversion Losses in Er3+-doped Integrated Amplifiers

L. Agazzi, J. Bradley, F. Ay, A. Kahn, H. Scheife, G. Huber, R.M. de Ridder, Kerstin Worhoff, Markus Pollnau

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    13 Downloads (Pure)

    Abstract

    At high Er3+ doping, electric dipole-dipole interactions between neighboring ions such as energy migration and energy-transfer upconversion (ETU) take place, thereby reducing the population inversion and negatively affecting the gain performance of the amplifier. These effects are investigated by lifetime and gain measurements respectively, in Al2O3:Er3+ waveguides and analyzed the results in the frame of the microscopic model developed by Zubenko et al.
    Original languageUndefined
    Title of host publicationConference on Lasers and Electro-Optics Europe
    Place of PublicationMunich
    PublisherIEEE
    PagesCE1.3 MON
    Number of pages1
    ISBN (Print)978-1-42444-079-5
    DOIs
    Publication statusPublished - 2009

    Publication series

    Name
    PublisherIEEE

    Keywords

    • METIS-265798
    • IOMS-APD: Active Photonic Devices
    • EWI-17453
    • IR-69945

    Cite this

    Agazzi, L., Bradley, J., Ay, F., Kahn, A., Scheife, H., Huber, G., ... Pollnau, M. (2009). Energy Migration Governs Upconversion Losses in Er3+-doped Integrated Amplifiers. In Conference on Lasers and Electro-Optics Europe (pp. CE1.3 MON). [10.1109/CLEOE-EQEC.2009.5196506] Munich: IEEE. https://doi.org/10.1109/CLEOE-EQEC.2009.5196506, https://doi.org/10.1109/CLEOE-EQEC.2009.5196506 - CE1.3 MON