Abstract
The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantaneously enhance by an order of magnitude upon the formation of nanocrystals inducing the atomic-scale onset of grain boundary diffusion
Original language | English |
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Article number | 014314 |
Pages (from-to) | 014314/1-014314/5 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 108 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2010 |
Keywords
- METIS-270289
- IR-75239
- EC Grant Agreement nr.: FP6/506008