Abstract
The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantaneously enhance by an order of magnitude upon the formation of nanocrystals inducing the atomic-scale onset of grain boundary diffusion
| Original language | English |
|---|---|
| Article number | 014314 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 108 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2010 |
Keywords
- EC Grant Agreement nr.: FP6/506008
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