Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
    68 Downloads (Pure)

    Abstract

    Continual advances in the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aims is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the P1500 standard.
    Original languageUndefined
    Title of host publicationProceedings of IEEE European Test Workshop ETW
    Place of PublicationMaastricht, The Netherlands
    PublisherIEEE
    Pages121-128
    Number of pages8
    ISBN (Print)0-7695-1908-3
    DOIs
    Publication statusPublished - 1 Mar 2003
    EventEighth IEEE European Test Workshop, 2003 - Maastricht, the Netherlands
    Duration: 25 May 200328 May 2003

    Publication series

    Name
    PublisherIEEE

    Workshop

    WorkshopEighth IEEE European Test Workshop, 2003
    Period25/05/0328/05/03
    Other25-28 May 2003

    Keywords

    • METIS-214897
    • IR-46401

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