Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores

H.J. Vermaak; H.G. Kerkhoff

doi:10.1109/ETW.2003.1231678

Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores

H.J. Vermaak
, H.G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

304 Downloads (Pure)

Abstract

Continual advances in the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aims is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the P1500 standard.

Original language	English
Title of host publication	Proceedings of the 8th IEEE European Test Workshop, ETW 2003
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	121-128
Number of pages	8
ISBN (Print)	0-7695-1908-3
DOIs	https://doi.org/10.1109/ETW.2003.1231678
Publication status	Published - 1 Mar 2003
Event	Eighth IEEE European Test Workshop, 2003 - Maastricht, the Netherlands Duration: 25 May 2003 → 28 May 2003

Publication series

Name	Proceedings IEEE European Test Workshop (ETW)
Publisher	IEEE
Number	8
Volume	2003
ISSN (Print)	1530-1877

Workshop

Workshop	Eighth IEEE European Test Workshop, 2003
Period	25/05/03 → 28/05/03
Other	25-28 May 2003

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1109/ETW.2003.1231678

Cite this

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title = "Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores",

abstract = "Continual advances in the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aims is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the P1500 standard.",

author = "H.J. Vermaak and H.G. Kerkhoff",

year = "2003",

month = mar,

day = "1",

doi = "10.1109/ETW.2003.1231678",

language = "English",

isbn = "0-7695-1908-3",

series = "Proceedings IEEE European Test Workshop (ETW)",

publisher = "IEEE",

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pages = "121--128",

booktitle = "Proceedings of the 8th IEEE European Test Workshop, ETW 2003",

address = "United States",

note = "Eighth IEEE European Test Workshop, 2003 ; Conference date: 25-05-2003 Through 28-05-2003",

}

Vermaak, HJ & Kerkhoff, HG 2003, Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores. in Proceedings of the 8th IEEE European Test Workshop, ETW 2003. Proceedings IEEE European Test Workshop (ETW), no. 8, vol. 2003, IEEE, Piscataway, NJ, pp. 121-128, Eighth IEEE European Test Workshop, 2003, 25/05/03. https://doi.org/10.1109/ETW.2003.1231678

Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores. / Vermaak, H.J.; Kerkhoff, H.G.
Proceedings of the 8th IEEE European Test Workshop, ETW 2003. Piscataway, NJ: IEEE, 2003. p. 121-128 (Proceedings IEEE European Test Workshop (ETW); Vol. 2003, No. 8).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Kerkhoff, H.G.

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Y1 - 2003/3/1

N2 - Continual advances in the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aims is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the P1500 standard.

AB - Continual advances in the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aims is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the P1500 standard.

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DO - 10.1109/ETW.2003.1231678

M3 - Conference contribution

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T3 - Proceedings IEEE European Test Workshop (ETW)

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BT - Proceedings of the 8th IEEE European Test Workshop, ETW 2003

PB - IEEE

CY - Piscataway, NJ

T2 - Eighth IEEE European Test Workshop, 2003

Y2 - 25 May 2003 through 28 May 2003

ER -

Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores

Abstract

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Workshop

UN SDGs

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