Abstract
Multilayer thin-film dielectric capacitors with high energy-storage performance and fast charge/discharge speed have significantly affected the development of miniaturized pulsed-power devices. Here, the interfacial strain in epitaxial multilayers of antiferroelectric PbZrO3 and relaxor-ferroelectric Pb0.9La0.1Zr0.52Ti0.48O3 is shown to significantly enhance the maximum polarization of the multilayer thin-film capacitors, beyond that of the composing individual layers. Insights obtained from atomically resolved energy-dispersive X-ray spectroscopy and high-resolution X-ray diffraction analysis of the interface and domain structure are used to develop phenomenological models that explain the observed trends in breakdown strength and energy-storage density as a function of multilayer period number. The underlying mechanism is the mechanical coupling between the layers that depends on the individual layer thicknesses. These factors result in a strongly enhanced recoverable energy-storage density (increased by a factor of 4 to ≈128.4 J cm−3) with high efficiency (≈81.2%). Moreover, the multilayer films show almost fatigue-free energy-storage performance after 1010 switching cycles, even at elevated temperatures up to 220 °C, demonstrating their robustness. The outstanding properties show the great potential of epitaxial multilayers for energy-storage applications, due to the well-defined separate layers and coupling of properties across the interfaces, not present in ceramic composites.
Original language | English |
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Article number | 2200517 |
Journal | Advanced energy materials |
Volume | 12 |
Issue number | 29 |
DOIs | |
Publication status | Published - 4 Aug 2022 |
Keywords
- antiferroelectrics
- breakdown strength
- energy storage
- multilayers
- relaxors
- UT-Hybrid-D