Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy

J.N. Beukers, J.E. Kleibeuker, Gertjan Koster, David H.A. Blank, Augustinus J.H.M. Rijnders, Johannes W.M. Hilgenkamp, Alexander Brinkman

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)5173-5176
Number of pages4
JournalThin solid films
Publication statusPublished - 2010


  • METIS-269426

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