Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)5173-5176
Number of pages4
JournalThin solid films
Volume518
Publication statusPublished - 2010

Keywords

  • METIS-269426

Cite this

@article{96f09a28ef9645899db7a1f3779f21e3,
title = "Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy",
keywords = "METIS-269426",
author = "J.N. Beukers and J.E. Kleibeuker and Gertjan Koster and Blank, {David H.A.} and Rijnders, {Augustinus J.H.M.} and Hilgenkamp, {Johannes W.M.} and Alexander Brinkman",
year = "2010",
language = "English",
volume = "518",
pages = "5173--5176",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

TY - JOUR

T1 - Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy

AU - Beukers, J.N.

AU - Kleibeuker, J.E.

AU - Koster, Gertjan

AU - Blank, David H.A.

AU - Rijnders, Augustinus J.H.M.

AU - Hilgenkamp, Johannes W.M.

AU - Brinkman, Alexander

PY - 2010

Y1 - 2010

KW - METIS-269426

M3 - Article

VL - 518

SP - 5173

EP - 5176

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -