Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy

J.N. Beukers; J.E. Kleibeuker; Gertjan Koster; David H.A. Blank; Augustinus J.H.M. Rijnders; Johannes W.M. Hilgenkamp; Alexander Brinkman

Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy

J.N. Beukers, J.E. Kleibeuker, Gertjan Koster, David H.A. Blank, Augustinus J.H.M. Rijnders, Johannes W.M. Hilgenkamp, Alexander Brinkman

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	5173-5176
Number of pages	4
Journal	Thin solid films
Volume	518
Publication status	Published - 2010

Keywords

METIS-269426

Cite this

@article{96f09a28ef9645899db7a1f3779f21e3,

title = "Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy",

keywords = "METIS-269426",

author = "J.N. Beukers and J.E. Kleibeuker and Gertjan Koster and Blank, {David H.A.} and Rijnders, {Augustinus J.H.M.} and Hilgenkamp, {Johannes W.M.} and Alexander Brinkman",

year = "2010",

language = "English",

volume = "518",

pages = "5173--5176",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy

AU - Beukers, J.N.

AU - Kleibeuker, J.E.

AU - Koster, Gertjan

AU - Blank, David H.A.

AU - Rijnders, Augustinus J.H.M.

AU - Hilgenkamp, Johannes W.M.

AU - Brinkman, Alexander

PY - 2010

Y1 - 2010

KW - METIS-269426

M3 - Article

SN - 0040-6090

VL - 518

SP - 5173

EP - 5176

JO - Thin solid films

JF - Thin solid films

ER -