ESD damage in integrated circuits

J.R.M. Luchies, A.J. Mouthaan, J.F. Verweij, Hans Wallinga

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 19 Nov 1991
    EventIOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands
    Duration: 19 Nov 199120 Nov 1991

    Conference

    ConferenceIOP/FOM Werkgemeenschap Halfgeleiders 1991
    CountryNetherlands
    CityVeldhoven
    Period19/11/9120/11/91

    Keywords

    • METIS-117285

    Cite this

    Luchies, J. R. M., Mouthaan, A. J., Verweij, J. F., & Wallinga, H. (1991). ESD damage in integrated circuits. -. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.