ESD damage in integrated circuits

J.R.M. Luchies, A.J. Mouthaan, J.F. Verweij, Hans Wallinga

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 19 Nov 1991
    EventIOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands
    Duration: 19 Nov 199120 Nov 1991

    Conference

    ConferenceIOP/FOM Werkgemeenschap Halfgeleiders 1991
    CountryNetherlands
    CityVeldhoven
    Period19/11/9120/11/91

    Keywords

    • METIS-117285

    Cite this

    Luchies, J. R. M., Mouthaan, A. J., Verweij, J. F., & Wallinga, H. (1991). ESD damage in integrated circuits. -. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.
    Luchies, J.R.M. ; Mouthaan, A.J. ; Verweij, J.F. ; Wallinga, Hans. / ESD damage in integrated circuits. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.
    @conference{a50e7d656ca348edab5a54e68269fe1d,
    title = "ESD damage in integrated circuits",
    keywords = "METIS-117285",
    author = "J.R.M. Luchies and A.J. Mouthaan and J.F. Verweij and Hans Wallinga",
    year = "1991",
    month = "11",
    day = "19",
    language = "English",
    pages = "--",
    note = "IOP/FOM Werkgemeenschap Halfgeleiders 1991 ; Conference date: 19-11-1991 Through 20-11-1991",

    }

    Luchies, JRM, Mouthaan, AJ, Verweij, JF & Wallinga, H 1991, 'ESD damage in integrated circuits' IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands, 19/11/91 - 20/11/91, pp. -.

    ESD damage in integrated circuits. / Luchies, J.R.M.; Mouthaan, A.J.; Verweij, J.F.; Wallinga, Hans.

    1991. - Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.

    Research output: Contribution to conferencePoster

    TY - CONF

    T1 - ESD damage in integrated circuits

    AU - Luchies, J.R.M.

    AU - Mouthaan, A.J.

    AU - Verweij, J.F.

    AU - Wallinga, Hans

    PY - 1991/11/19

    Y1 - 1991/11/19

    KW - METIS-117285

    M3 - Poster

    SP - -

    ER -

    Luchies JRM, Mouthaan AJ, Verweij JF, Wallinga H. ESD damage in integrated circuits. 1991. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.