@inproceedings{6f20441ee972458088c6c1853fe685c3,
title = "Estimation of refractive index profiles of vertically aligned disordered silicon nanowires for photon management applications",
abstract = "We discuss a promising method to assess the refractive index profile of vertically aligned disordered Silicon nanowire arrays. The aberration-free micro-reflectivity set-up equipped with an in-situ optical microscope is designed to measure the reflectivity from 4μm2 area of the nanowires. The spatial- and polarization-dependent reflectivity values along the nanowire length is used to estimate the refractive index profile. The transfer matrix method involving the estimated refractive index profiles is employed to corroborate the measured reflectivity values. The disordered Silicon nanowires with gradient refractive index profile can suppress 96 \% reflectivity irrespective of direction, wavelength, and polarization which make them a potential candidate for photon management applications.",
keywords = "Antireflection nanostructures, Gradient refractive index, Silicon nanowires, Subwavelength photonic structures",
author = "Saini, \{Sudhir Kumar\} and Nair, \{Rajesh V.\}",
note = "Funding Information: The authors would like to thank IIT Ropar, DST-SERB, INSA, and CSIR for research funding. Sudhir thanks MeitY, Govt. of India Visvesvaraya PhD fellowship. Publisher Copyright: {\textcopyright} 2019 SPIE.; SPIE Micro + Nano Materials, Devices, and Applications 2019 ; Conference date: 09-12-2019 Through 12-12-2019",
year = "2019",
doi = "10.1117/12.2538476",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Simpson, \{M. Cather\} and Saulius Juodkazis",
booktitle = "SPIE Micro + Nano Materials, Devices, and Applications 2019",
address = "United States",
}