Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors

N. Golo-Tosic, S. van der Wal, F.G. Kuper, A.J. Mouthaan

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)3337-3339
    Number of pages3
    JournalApplied physics letters
    Issue number18
    Publication statusPublished - 2002


    • METIS-210016

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