Evaluating the data integrity of memory systems by configurable Markov models

M. Ottavi; L. Schiano; F. Lombardi; S. Pontarelli; G.C. Cardarilli

doi:10.1109/ISVLSI.2005.30

Evaluating the data integrity of memory systems by configurable Markov models

M. Ottavi
, L. Schiano
, F. Lombardi
, S. Pontarelli
, G.C. Cardarilli

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

Abstract

In this paper, a novel method for the evaluation of the bit error rate (BER) as measure for assessing data integrity in memory systems is proposed; such method improves modeling by introducing configurability features in the Markov chains to account for environmental and operational changes. For modeling erasures and random errors, the occurrence of new time-varying features is introduced in the analysis to characterize the behavior of memory systems for space applications (using Reed-Solomon codes as EDAC). Moreover, differently from existing techniques, the nature of these features (such as scrubbing and the effects of the so-called South Atlantic Anomaly on SEU rates) is assessed using a deterministic framework.

Original language	English
Title of host publication	Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI
DOIs	https://doi.org/10.1109/ISVLSI.2005.30
Publication status	Published - 2005
Externally published	Yes
Event	IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2005: New Frontiers in VLSI Design - Tampa, United States Duration: 11 May 2005 → 12 May 2005

Conference

Conference	IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2005
Abbreviated title	ISVLSI 2005
Country/Territory	United States
City	Tampa
Period	11/05/05 → 12/05/05

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10.1109/ISVLSI.2005.30

Cite this

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title = "Evaluating the data integrity of memory systems by configurable Markov models",

abstract = "In this paper, a novel method for the evaluation of the bit error rate (BER) as measure for assessing data integrity in memory systems is proposed; such method improves modeling by introducing configurability features in the Markov chains to account for environmental and operational changes. For modeling erasures and random errors, the occurrence of new time-varying features is introduced in the analysis to characterize the behavior of memory systems for space applications (using Reed-Solomon codes as EDAC). Moreover, differently from existing techniques, the nature of these features (such as scrubbing and the effects of the so-called South Atlantic Anomaly on SEU rates) is assessed using a deterministic framework.",

author = "M. Ottavi and L. Schiano and F. Lombardi and S. Pontarelli and G.C. Cardarilli",

year = "2005",

doi = "10.1109/ISVLSI.2005.30",

language = "English",

isbn = "0-7695-2365-X",

booktitle = "Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI",

note = "IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2005 : New Frontiers in VLSI Design, ISVLSI 2005 ; Conference date: 11-05-2005 Through 12-05-2005",

}

Ottavi, M, Schiano, L, Lombardi, F, Pontarelli, S & Cardarilli, GC 2005, Evaluating the data integrity of memory systems by configurable Markov models. in Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI. IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2005, Tampa, Florida, United States, 11/05/05. https://doi.org/10.1109/ISVLSI.2005.30

TY - GEN

T1 - Evaluating the data integrity of memory systems by configurable Markov models

AU - Ottavi, M.

AU - Schiano, L.

AU - Lombardi, F.

AU - Pontarelli, S.

AU - Cardarilli, G.C.

PY - 2005

Y1 - 2005

N2 - In this paper, a novel method for the evaluation of the bit error rate (BER) as measure for assessing data integrity in memory systems is proposed; such method improves modeling by introducing configurability features in the Markov chains to account for environmental and operational changes. For modeling erasures and random errors, the occurrence of new time-varying features is introduced in the analysis to characterize the behavior of memory systems for space applications (using Reed-Solomon codes as EDAC). Moreover, differently from existing techniques, the nature of these features (such as scrubbing and the effects of the so-called South Atlantic Anomaly on SEU rates) is assessed using a deterministic framework.

AB - In this paper, a novel method for the evaluation of the bit error rate (BER) as measure for assessing data integrity in memory systems is proposed; such method improves modeling by introducing configurability features in the Markov chains to account for environmental and operational changes. For modeling erasures and random errors, the occurrence of new time-varying features is introduced in the analysis to characterize the behavior of memory systems for space applications (using Reed-Solomon codes as EDAC). Moreover, differently from existing techniques, the nature of these features (such as scrubbing and the effects of the so-called South Atlantic Anomaly on SEU rates) is assessed using a deterministic framework.

UR - https://www.scopus.com/pages/publications/26844446449

U2 - 10.1109/ISVLSI.2005.30

DO - 10.1109/ISVLSI.2005.30

M3 - Conference contribution

SN - 0-7695-2365-X

BT - Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI

T2 - IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2005

Y2 - 11 May 2005 through 12 May 2005

ER -

Evaluating the data integrity of memory systems by configurable Markov models

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