Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves

N.F. van Hulst, F.B. Segerink, F. Achten, B. Bölger

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Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.
Original languageEnglish
Pages (from-to)416-421
Number of pages5
Issue numberPart 1
Publication statusPublished - 1992
Event6th International Conference on Scanning Tunneling Microscopy, STM 1991 - Interlaken, Switzerland
Duration: 12 Aug 199116 Aug 1991
Conference number: 6


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