Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves

N.F. van Hulst; F.B. Segerink; F. Achten; B. Bölger

doi:10.1016/0304-3991(92)90301-Y

Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves

N.F. van Hulst, F.B. Segerink, F. Achten, B. Bölger

Optical Sciences

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Abstract

Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.

Original language	English
Pages (from-to)	416-421
Number of pages	5
Journal	Ultramicroscopy
Volume	42-44
Issue number	Part 1
DOIs	https://doi.org/10.1016/0304-3991(92)90301-Y
Publication status	Published - 1992
Event	6th International Conference on Scanning Tunneling Microscopy, STM 1991 - Interlaken, Switzerland Duration: 12 Aug 1991 → 16 Aug 1991 Conference number: 6

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title = "Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves",

abstract = "Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.",

author = "{van Hulst}, N.F. and F.B. Segerink and F. Achten and B. B{\"o}lger",

year = "1992",

doi = "10.1016/0304-3991(92)90301-Y",

language = "English",

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pages = "416--421",

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T2 - 6th International Conference on Scanning Tunneling Microscopy, STM 1991

AU - van Hulst, N.F.

AU - Segerink, F.B.

AU - Achten, F.

AU - Bölger, B.

N1 - Conference code: 6

PY - 1992

Y1 - 1992

N2 - Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.

AB - Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.

U2 - 10.1016/0304-3991(92)90301-Y

DO - 10.1016/0304-3991(92)90301-Y

M3 - Article

SN - 0304-3991

VL - 42-44

SP - 416

EP - 421

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - Part 1

Y2 - 12 August 1991 through 16 August 1991

ER -

Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves

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