Abstract
The recently developed double cell technique, which describes the optical response of an arbitrary semi-infinite dielectric crystal taking into account internal field effects, is extended to include the response of thick slabs. The surface sensitivity of the first technique is fully retained. The implications of the internal field effects on the microscopy of these thick slabs are examined for three simple model systems. Further, we investigated under which conditions deviations from classical Fresnel-behaviour are to be expected and how important these corrections are.
Original language | English |
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Pages (from-to) | 221-237 |
Number of pages | 0 |
Journal | Physica B |
Volume | 167 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1990 |