Extended x-ray absorption fine structure measurements of a Co78Cr22 film were performed using normal and glancing incident radiation in order to investigate, respectively, the in-plane and out-of-plane local structure and chemistry. The Fourier transformed EXAFS data of the in-plane and out-of-plane structures around the Co and Cr atoms illustrates the presence of an anisotropy. Analysis of the local environments around Co for the two sample orientations indicates the presence of Co-enriched clusters, while similar studies of the Cr environments indicate preferential ordering parallel to the film plane. Quantitative analysis of the higher order Fourier transform peaks shows a greater amount of disorder perpendicular to the film plane beyond that expected for a textured hcp film. These results are consistent with earlier reports of a high density of stacking faults or twinning planes perpendicular to the growth axis, supporting the interpretation that a platelet-like texturing exists within the columnar microstructure.
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Kemner, K. M., Harris, V. G., Elam, W. T., & Lodder, J. C. (1995). Exafs studies and simulations of local anisotropy in Co-Cr films. Materials Research Society symposia proceedings, 375, 21-2?. https://doi.org/10.1557/PROC-375-21