Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy

S. Rieger, M. Fischedick, Klaus J. Boller, Carsten Fallnich

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Resonance Raman scattering was suppressed by 50% via ground state depletion in Tris(bipyridine)ruthenium(II). This concept of Raman suppression is of high interest for enhancing the resolution of Raman microscopy to below the diffraction limit
Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics
Place of PublicationSan Jose, California, USA
PublisherOSA Technical Digest
PagesSF1H.2-
DOIs
Publication statusPublished - 5 Jun 2016
EventConference on Lasers and Electro-Optics, CLEO 2016 - San Jose Convention Center, San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

Name
PublisherOSA Technical Digest

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2016
Abbreviated titleCLEO
CountryUnited States
CitySan Jose
Period5/06/1610/06/16
Other5-10 June 2016

Fingerprint

resonance scattering
ruthenium
depletion
spatial resolution
retarding
Raman spectra
microscopy
ground state
augmentation
diffraction

Keywords

  • METIS-317165
  • IR-103201

Cite this

Rieger, S. ; Fischedick, M. ; Boller, Klaus J. ; Fallnich, Carsten. / Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy. Conference on Lasers and Electro-Optics. San Jose, California, USA : OSA Technical Digest, 2016. pp. SF1H.2-
@inproceedings{677fa695d6b141d9a457412208b1a522,
title = "Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy",
abstract = "Resonance Raman scattering was suppressed by 50{\%} via ground state depletion in Tris(bipyridine)ruthenium(II). This concept of Raman suppression is of high interest for enhancing the resolution of Raman microscopy to below the diffraction limit",
keywords = "METIS-317165, IR-103201",
author = "S. Rieger and M. Fischedick and Boller, {Klaus J.} and Carsten Fallnich",
year = "2016",
month = "6",
day = "5",
doi = "10.1364/CLEO_SI.2016.SF1H.2",
language = "English",
publisher = "OSA Technical Digest",
pages = "SF1H.2--",
booktitle = "Conference on Lasers and Electro-Optics",

}

Rieger, S, Fischedick, M, Boller, KJ & Fallnich, C 2016, Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy. in Conference on Lasers and Electro-Optics. OSA Technical Digest, San Jose, California, USA, pp. SF1H.2-, Conference on Lasers and Electro-Optics, CLEO 2016, San Jose, United States, 5/06/16. https://doi.org/10.1364/CLEO_SI.2016.SF1H.2

Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy. / Rieger, S.; Fischedick, M.; Boller, Klaus J.; Fallnich, Carsten.

Conference on Lasers and Electro-Optics. San Jose, California, USA : OSA Technical Digest, 2016. p. SF1H.2-.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy

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AU - Boller, Klaus J.

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AB - Resonance Raman scattering was suppressed by 50% via ground state depletion in Tris(bipyridine)ruthenium(II). This concept of Raman suppression is of high interest for enhancing the resolution of Raman microscopy to below the diffraction limit

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DO - 10.1364/CLEO_SI.2016.SF1H.2

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