Exploitation of gate material and gate oxide properties for FET sensors

Piet Bergveld

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of Third Int. Workshop on Materials Science (IWOMS'99)
    Place of PublicationHanoi, Vietnam
    Number of pages5
    Publication statusPublished - 2 Nov 1999


    • METIS-113814

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