Exploiting channeling in Helium Ion Microscopy

Gregor Hlawacek, Vasilisa Veligura, Stefan Lorbek, Tijs F. Mocking, Anton George, Raoul Van Gastel, Harold J.W. Zandvliet, Bene Poelsema

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)806-807
Number of pages2
JournalMicroscopy and microanalysis
Volume18
Issue numberS2
DOIs
Publication statusPublished - 23 Nov 2012

Cite this

Hlawacek, G., Veligura, V., Lorbek, S., Mocking, T. F., George, A., Van Gastel, R., ... Poelsema, B. (2012). Exploiting channeling in Helium Ion Microscopy. Microscopy and microanalysis, 18(S2), 806-807. https://doi.org/10.1017/S1431927612005880
Hlawacek, Gregor ; Veligura, Vasilisa ; Lorbek, Stefan ; Mocking, Tijs F. ; George, Anton ; Van Gastel, Raoul ; Zandvliet, Harold J.W. ; Poelsema, Bene. / Exploiting channeling in Helium Ion Microscopy. In: Microscopy and microanalysis. 2012 ; Vol. 18, No. S2. pp. 806-807.
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title = "Exploiting channeling in Helium Ion Microscopy",
author = "Gregor Hlawacek and Vasilisa Veligura and Stefan Lorbek and Mocking, {Tijs F.} and Anton George and {Van Gastel}, Raoul and Zandvliet, {Harold J.W.} and Bene Poelsema",
year = "2012",
month = "11",
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Hlawacek, G, Veligura, V, Lorbek, S, Mocking, TF, George, A, Van Gastel, R, Zandvliet, HJW & Poelsema, B 2012, 'Exploiting channeling in Helium Ion Microscopy', Microscopy and microanalysis, vol. 18, no. S2, pp. 806-807. https://doi.org/10.1017/S1431927612005880

Exploiting channeling in Helium Ion Microscopy. / Hlawacek, Gregor; Veligura, Vasilisa; Lorbek, Stefan; Mocking, Tijs F.; George, Anton; Van Gastel, Raoul; Zandvliet, Harold J.W.; Poelsema, Bene.

In: Microscopy and microanalysis, Vol. 18, No. S2, 23.11.2012, p. 806-807.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Exploiting channeling in Helium Ion Microscopy

AU - Hlawacek, Gregor

AU - Veligura, Vasilisa

AU - Lorbek, Stefan

AU - Mocking, Tijs F.

AU - George, Anton

AU - Van Gastel, Raoul

AU - Zandvliet, Harold J.W.

AU - Poelsema, Bene

PY - 2012/11/23

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U2 - 10.1017/S1431927612005880

DO - 10.1017/S1431927612005880

M3 - Article

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SP - 806

EP - 807

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

SN - 1431-9276

IS - S2

ER -

Hlawacek G, Veligura V, Lorbek S, Mocking TF, George A, Van Gastel R et al. Exploiting channeling in Helium Ion Microscopy. Microscopy and microanalysis. 2012 Nov 23;18(S2):806-807. https://doi.org/10.1017/S1431927612005880